| Progress in Transmission Electron Microscopy 2: Applications in Materials Science 2001 Edition Contributor(s): Zhang, Xiao-Feng (Editor), Zhang, Ze (Editor) |
|
 |
ISBN: 3540676813 ISBN-13: 9783540676812 Publisher: Springer OUR PRICE: $104.49 Product Type: Hardcover - Other Formats Published: October 2001 |
| Additional Information |
| BISAC Categories: - Science | Electron Microscopes & Microscopy - Technology & Engineering | Materials Science - Thin Films, Surfaces & Interfaces - Science | Physics - Condensed Matter |
| Dewey: 502.825 |
| LCCN: 00045028 |
| Series: Springer Series in Surface Sciences, |
| Physical Information: 0.75" H x 6.14" W x 9.21" (1.41 lbs) 307 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes. |