| Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques 2008 Edition Contributor(s): Bhushan, Bharat (Editor), Fuchs, Harald (Editor), Tomitori, Masahiko (Editor) |
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ISBN: 3540740791 ISBN-13: 9783540740797 Publisher: Springer OUR PRICE: $161.49 Product Type: Hardcover - Other Formats Published: January 2008 Annotation: The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Nanotechnology & Mems - Science | Chemistry - Physical & Theoretical - Technology & Engineering | Materials Science - Thin Films, Surfaces & Interfaces |
| Dewey: 502.82 |
| Series: Nanoscience and Technology |
| Physical Information: 0.94" H x 6.46" W x 9.42" (1.85 lbs) 465 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: The success of the Springer Series Applied Scanning Probe Methods I-VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides, tribological characterization, mechanical properties ofpolymernanostructures, technical polymers, and near eld optics. |