| Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques 2009 Edition Contributor(s): Bhushan, Bharat (Editor), Fuchs, Harald (Editor) |
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ISBN: 3540850368 ISBN-13: 9783540850366 Publisher: Springer OUR PRICE: $161.49 Product Type: Hardcover - Other Formats Published: November 2008 Annotation: The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Nanotechnology & Mems - Science | Chemistry - Analytic - Technology & Engineering | Materials Science - Thin Films, Surfaces & Interfaces |
| Dewey: 502.82 |
| Series: Nanoscience and Technology |
| Physical Information: 0.6" H x 6.3" W x 9.4" (1.15 lbs) 236 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: The ability to accurately and reproducibly measure the properties and perf- mance characteristics of nanoscale materials, devices, and systems is a critical enabler for progress in fundamental nanoscience, in the design of new nanoma- rials, and ultimately in manufacturing new nanoscale products 1]. This quotation from the US National Nanotechnology Initiative emphasizes the need for measu- ment tools in emerging nanomaterial applications, a eld predicted to generate a multibillion-dollar market within 10 years. One speci c measurement need is for nanomechanical information knowledge on the nanoscale of mechanical prop- ties such as elastic modulus, adhesion, and friction. Accurate information is essential not only to predict the performance of a system before use, but also to evaluate its reliability during or after use. The measurement need is motivated partly by the fact that new applications often involve structures with nanoscale dimensions (e. g., nanoelectromechanical systems, nanoimprint lithography). Measurements of such structures by necessity must provide nanoscale spatial resolution. Other new structures have larger overall dimensions, but integrate disparate materials on the micro- or nanoscale (e. g., electronic interconnect, nanocomposites). In such cases, nanoscale information is needed in order to differentiate the properties of the various components. Many methods to measure small-scale mechanical properties have been devised, including ones based on indentation 2 4], on ultrasonics 5,6], and on other phy- cal phenomena 7,8]. Such methods often have drawbacks: they are not suf ciently quantitative, are limited to specialized geometries, and so forth." |