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Noncontact Atomic Force Microscopy: Volume 2 2009 Edition
Contributor(s): Morita, Seizo (Editor), Giessibl, Franz J. (Editor), Wiesendanger, Roland (Editor)
ISBN: 3642014941     ISBN-13: 9783642014949
Publisher: Springer
OUR PRICE:   $237.49  
Product Type: Hardcover - Other Formats
Published: October 2009
Qty:
Additional Information
BISAC Categories:
- Technology & Engineering | Nanotechnology & Mems
- Technology & Engineering | Materials Science - General
- Technology & Engineering | Engineering (general)
Dewey: 620.5
Series: Nanoscience and Technology
Physical Information: 1" H x 6.1" W x 9.2" (1.55 lbs) 401 pages
 
Descriptions, Reviews, Etc.
Publisher Description:

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.