Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications Contributor(s): Rein, Stefan (Author) |
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ISBN: 3642064531 ISBN-13: 9783642064531 Publisher: Springer OUR PRICE: $313.49 Product Type: Paperback - Other Formats Published: October 2010 |
Additional Information |
BISAC Categories: - Science | Physics - Condensed Matter - Technology & Engineering | Optics - Science | Spectroscopy & Spectrum Analysis |
Dewey: 661.068 |
Series: Springer Materials Science |
Physical Information: 1.05" H x 6.14" W x 9.21" (1.59 lbs) 492 pages |