| Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces Contributor(s): Kaupp, Gerd (Author) |
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ISBN: 3642066631 ISBN-13: 9783642066634 Publisher: Springer OUR PRICE: $208.99 Product Type: Paperback - Other Formats Published: February 2010 |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Nanotechnology & Mems - Science | Chemistry - Physical & Theoretical - Medical | Biochemistry |
| Dewey: 502.82 |
| Series: Nanoscience and Technology |
| Physical Information: 0.65" H x 6.14" W x 9.21" (0.96 lbs) 292 pages |