| Atomic and Nuclear Analytical Methods: Xrf, Mössbauer, Xps, Naa and Ion-Beam Spectroscopic Techniques Contributor(s): Verma, Hem Raj (Author) |
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ISBN: 3642067735 ISBN-13: 9783642067730 Publisher: Springer OUR PRICE: $284.99 Product Type: Paperback - Other Formats Published: February 2010 |
| Additional Information |
| BISAC Categories: - Science | Weights & Measures - Science | Chemistry - Analytic - Science | Physics - Atomic & Molecular |
| Dewey: 535.84 |
| Physical Information: 0.81" H x 6.14" W x 9.21" (1.21 lbs) 376 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: This book compares and offers a comprehensive overview of nine analytical techniques important in material science and many other branches of science. All these methods are already well adapted to applications in diverse fields such as medical, environmental studies, archaeology, and materials science. This clearly presented reference describes and compares the principles of the methods and the various source and detector types. |