| Progress in Transmission Electron Microscopy 1: Concepts and Techniques Contributor(s): Zhang, Xiao-Feng (Editor), Zhang, Ze (Editor) |
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ISBN: 3642087175 ISBN-13: 9783642087172 Publisher: Springer OUR PRICE: $161.49 Product Type: Paperback - Other Formats Published: December 2010 |
| Additional Information |
| BISAC Categories: - Science | Electron Microscopes & Microscopy - Technology & Engineering | Materials Science - Thin Films, Surfaces & Interfaces - Science | Astronomy |
| Dewey: 502.825 |
| Series: Springer Series in Surface Sciences |
| Physical Information: 0.8" H x 6.14" W x 9.21" (1.19 lbs) 367 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. |