| Measurement, Modelling, and Evaluation of Computing Systems and Dependability in Fault Tolerance: 15th International Gi/ITG Conference, Mmb & DFT 2010 Contributor(s): Rathgeb, Erwin (Editor), Echtle, Klaus (Editor), Müller-Clostermann, Bruno (Editor) |
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ISBN: 3642121039 ISBN-13: 9783642121036 Publisher: Springer OUR PRICE: $52.24 Product Type: Paperback Published: March 2010 |
| Additional Information |
| BISAC Categories: - Computers | Software Development & Engineering - General - Computers | Networking - Hardware - Computers | Compilers |
| Dewey: 005.1 |
| Series: Lecture Notes in Computer Science |
| Physical Information: 0.7" H x 6.1" W x 9" (1.10 lbs) 323 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: This volume contains the papers presented at the International GI/ITG C- ference on "Measurement, Modelling and Evaluation of Computing Systems" and "Dependability and Fault Tolerance," held during March 15-17, 2010 in Essen, Germany, hosted by the University of Duisburg-Essen. The Technical Committees of MMBand DFT coverallaspects ofperformanceand dependab- ityevaluationofsystemsincludingnetworks, computerarchitectures, distributed systems, software, fault-tolerant and secure systems. In 2010, both committees joined forces in a common conference MMB & DFT 2010. This current conf- ence was the 15th in a series of biannual conferences, initially started in 1981, with previous editions in Aachen, Dresden, Nuremberg and Dortmund. MMB & DFT 2010 received 42 submissions (37 regular papers and 5 tool descriptions) by authors from 15 di?erent countries. Each regular paper was reviewed by at least three (and up to ?ve) Program Committee members and external reviewers; tool papers were reviewed by two reviewers. In total we - ceived 158 reviews and the ProgramCommittee decided to accept 19 full papers and 5 tool papers. TheprogramwascompletedbytwoinvitedtalksandwewerehappythatPhil Koopman from Carnegie Mellon University and Paul Kuhn ] from the University of Stuttgart accepted to give an invited talk at the conference. |