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Near-Field Characterization of Micro/Nano-Scaled Fluid Flows
Contributor(s): Kihm, Kenneth D. (Author)
ISBN: 3642204252     ISBN-13: 9783642204258
Publisher: Springer
OUR PRICE:   $104.49  
Product Type: Hardcover - Other Formats
Published: April 2011
Qty:
Additional Information
BISAC Categories:
- Science | Mechanics - Fluids
- Science | Nanoscience
- Science | Mechanics - Thermodynamics
Dewey: 620.106
Series: Experimental Fluid Mechanics
Physical Information: 0.6" H x 6.2" W x 9.3" (0.80 lbs) 156 pages
 
Descriptions, Reviews, Etc.
Publisher Description:

The near-field region within an order of 100 nm from the solid interface is an exciting and crucial arena where many important multiscale transport phenomena are physically characterized, such as flow mixing and drag, heat and mass transfer, near-wall behavior of nanoparticles, binding of bio-molecules, crystallization, surface deposition processes, just naming a few. This monograph presents a number of label-free experimental techniques developed and tested for near-field fluid flow characterization. Namely, these include Total Internal Reflection Microscopy (TIRM), Optical Serial Sectioning Microscopy (OSSM), Surface Plasmon Resonance Microscopy (SPRM), Interference Reflection Contrast Microscopy (IRCM), Thermal Near-Field Anemometry, Scanning Thermal Microscopy (STM), and Micro-Cantilever Near-Field Thermometry. Presentation on each of these is laid out for the working principle, how to implement the system, and its example applications, to promote the readers understanding and knowledge of the specific technique that can be applied for their own research interests.