| Noncontact Atomic Force Microscopy: Volume 2 2009 Edition Contributor(s): Morita, Seizo (Editor), Giessibl, Franz J. (Editor), Wiesendanger, Roland (Editor) |
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ISBN: 3642260705 ISBN-13: 9783642260704 Publisher: Springer OUR PRICE: $237.49 Product Type: Paperback - Other Formats Published: March 2012 |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Nanotechnology & Mems - Technology & Engineering | Materials Science - General - Technology & Engineering | Engineering (general) |
| Dewey: 620.5 |
| Series: Nanoscience and Technology |
| Physical Information: 0.86" H x 6.14" W x 9.21" (1.29 lbs) 401 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology. |