| New Approaches to Reliability Qualification of Semiconductor Components under Varying and Progressive Stresses Contributor(s): Hirler, Alexander (Author) |
|
 |
ISBN: 3736975201 ISBN-13: 9783736975200 Publisher: Cuvillier OUR PRICE: $58.07 Product Type: Paperback Published: November 2021 |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Construction - Electrical |
| Physical Information: 0.35" H x 5.83" W x 8.27" (0.45 lbs) 166 pages |