| Yarkostnyy I Chastotnyy Analiz Izobrazheniy Defektov Struktury Contributor(s): Tkal' Valeriy (Author), Okunev Aleksey (Author), Zhukovskaya Inga (Author) |
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ISBN: 3846588555 ISBN-13: 9783846588550 Publisher: LAP Lambert Academic Publishing OUR PRICE: $81.05 Product Type: Paperback Language: Russian Published: February 2012 |
| Additional Information |
| BISAC Categories: - Science | Physics - General |
| Physical Information: 0.87" H x 6" W x 9" (1.26 lbs) 392 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: V monografii rassmatrivaetsya tsifrovaya obrabotka topograficheskikh i polyarizatsionno-opticheskikh izobrazheniy defektov struktury monokristallov, osnovannaya na analize ikh yarkostnykh i chastotnykh kharakteristik. Privodyatsya metodiki, algoritmy i programmy tsifrovoy obrabotki, primery primeneniya i sravnenie ikh effektivnosti pri ustranenii osnovnykh zashumlyayushchikh faktorov, zatrudnyayushchikh rasshifrovku eksperimental'nogo kontrasta i nadyezhnuyu identifikatsiyu defektov struktury. Pokazany preimushchestva diskretnogo veyvlet-analiza pri ustranenii slabogo kontrasta, fonovoy neodnorodnosti i zernistosti izobrazheniy, a takzhe ispol'zovaniya pri tsifrovoy obrabotke izobrazheniy s rasshirennym dinamicheskim diapazonom (HDR-izobrazheniy). Tsifrovaya obrabotka pozvolyaet vyyavit' tonkie osobennosti kontrasta i poluchit' novuyu kachestvennuyu i kolichestvennuyu informatsiyu o defektakh struktury, povysit' informativnost' diagnosticheskikh metodov. Prednaznachaetsya dlya nauchnykh rabotnikov, inzhenerov, prepodavateley i studentov, spetsializiruyushchikhsya v oblasti fizicheskogo materialovedeniya, kristallofiziki, tekhnologii materialov elektronnoy tekhniki, tsifrovoy obrabotki signalov i izobrazheniy. |