| Design, Analysis and Test of Logic Circuits Under Uncertainty 2013 Edition Contributor(s): Krishnaswamy, Smita (Author), Markov, Igor L. (Author), Hayes, John P. (Author) |
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ISBN: 9400797982 ISBN-13: 9789400797987 Publisher: Springer OUR PRICE: $104.49 Product Type: Paperback - Other Formats Published: October 2014 |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Electronics - Circuits - General - Computers | Computer Science - Computers | Logic Design |
| Dewey: 621.395 |
| Series: Lecture Notes in Electrical Engineering |
| Physical Information: 0.29" H x 6.14" W x 9.21" (0.44 lbs) 124 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior. |