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New Technologies in Electromagnetic Non-Destructive Testing 2016 Edition
Contributor(s): Huang, Songling (Author), Wang, Shen (Author)
ISBN: 981100577X     ISBN-13: 9789811005770
Publisher: Springer
OUR PRICE:   $104.49  
Product Type: Hardcover - Other Formats
Published: March 2016
Qty:
Additional Information
BISAC Categories:
- Technology & Engineering | Electronics - Circuits - General
- Technology & Engineering | Materials Science - General
- Science | Weights & Measures
Dewey: 530.8
Series: Springer Measurement Science and Technology
Physical Information: 0.56" H x 6.14" W x 9.21" (1.11 lbs) 222 pages
 
Descriptions, Reviews, Etc.
Publisher Description:

This book introduces novel developments in the field of electromagnetic non-destructive testing and evaluation (NDT/E). The topics include electromagnetic ultrasonic guided wave testing, pulsed eddy current testing, remote field eddy current testing, low frequency eddy current testing, metal magnetic memory testing, and magnetic flux leakage testing. Considering the increasing concern about the safety maintenance of critical structures in various industries and everyday life, these topics presented here will be of particular interest to the readers in the NDT/E field. This book covers both theoretical researches and the engineering applications of the electromagnetic NDT technology. It could serve as a valuable reference for college students and relevant NDT technicians. It is also a useful material for qualification training and higher learning for nondestructive testing professionals.