| Practical Electron Microscopy of Lattice Defects Contributor(s): Saka, Hiroyasu (Author) |
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ISBN: 9811234698 ISBN-13: 9789811234699 Publisher: World Scientific Publishing Company OUR PRICE: $102.60 Product Type: Hardcover Published: April 2021 |
| Additional Information |
| BISAC Categories: - Science | Electron Microscopes & Microscopy - Science | Physics - Crystallography - Technology & Engineering | Materials Science - General |
| Physical Information: 0.75" H x 6" W x 9" (1.29 lbs) 308 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: This unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided. |