| Progress in Nanoscale Characterization and Manipulation 2018 Edition Contributor(s): Wang, Rongming (Editor), Wang, Chen (Editor), Zhang, Hongzhou (Editor) |
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ISBN: 981130453X ISBN-13: 9789811304538 Publisher: Springer OUR PRICE: $170.99 Product Type: Hardcover - Other Formats Published: September 2018 |
| Additional Information |
| BISAC Categories: - Science | Nanoscience - Technology & Engineering | Materials Science - General - Science | Spectroscopy & Spectrum Analysis |
| Dewey: 620.11 |
| Series: Springer Tracts in Modern Physics |
| Physical Information: 1.13" H x 6.14" W x 9.21" (1.98 lbs) 508 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field. |