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Research on the Radiation Effects and Compact Model of Sige Hbt Softcover Repri Edition
Contributor(s): Sun, Yabin (Author)
ISBN: 9811351813     ISBN-13: 9789811351815
Publisher: Springer
OUR PRICE:   $104.49  
Product Type: Paperback - Other Formats
Published: January 2019
Qty:
Additional Information
BISAC Categories:
- Technology & Engineering | Electronics - Semiconductors
- Technology & Engineering | Materials Science - Electronic Materials
- Science | Physics - Condensed Matter
Dewey: 530.41
Series: Springer Theses
Physical Information: 0.41" H x 6.14" W x 9.21" (0.61 lbs) 168 pages
 
Descriptions, Reviews, Etc.
Publisher Description:
This book primarily focuses on the radiation effects and compact model of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs). It introduces the small-signal equivalent circuit of SiGe HBTs including the distributed effects, and proposes a novel direct analytical extraction technique based on non-linear rational function fitting. It also presents the total dose effects irradiated by gamma rays and heavy ions, as well as the single-event transient induced by pulse laser microbeams. It offers readers essential information on the irradiation effects technique and the SiGe HBTs model using that technique.