| On-Line Testing for VLSI Reprinted from Edition Contributor(s): Nicolaidis, Michael (Editor), Zorian, Yervant (Editor), Pradhan, Dhiraj (Editor) |
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ISBN: 0792381327 ISBN-13: 9780792381327 Publisher: Springer OUR PRICE: $104.49 Product Type: Hardcover - Other Formats Published: April 1998 Annotation: Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers. |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Electronics - Circuits - Vlsi & Ulsi - Technology & Engineering | Electrical |
| Dewey: 621.381 |
| LCCN: 98002694 |
| Series: Frontiers in Electronic Testing |
| Physical Information: 0.44" H x 7" W x 10" (1.13 lbs) 160 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers. |