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  (8 items found)
Title Author / Artist Prod Type ISBN/ISBN-13
or UPC
Pub
Date
Price
Collaboration and Technology: 21st International Conference, Criwg 2015, Yerevan, Armenia, September 22-25, 2015, Proceedings 2015 Edition Baloian, NelsonPaperback3319227467 /
9783319227467
08/2015$52.24
Embedded Processor-Based Self-Test 2004 Edition (Frontiers in Electronic Testing)Gizopoulos, DimitrisHardcover1402027850 /
9781402027857
12/2004$161.49
Embedded Processor-Based Self-Test Softcover Repri Edition (Frontiers in Electronic Testing)Gizopoulos, DimitrisPaperback1441952527 /
9781441952523
12/2011$161.49
Multi-Chip Module Test Strategies Reprinted from Edition (Frontiers in Electronic Testing)Zorian, YervantHardcover079239920X /
9780792399209
05/1997$104.49
Multi-Chip Module Test Strategies Softcover Repri Edition (Frontiers in Electronic Testing)Zorian, YervantPaperback1461377986 /
9781461377986
10/2012$104.49
On-Line Testing for VLSI (Frontiers in Electronic Testing)Nicolaidis, MichaelPaperback1441950338 /
9781441950338
12/2010$104.49
On-Line Testing for VLSI Reprinted from Edition (Frontiers in Electronic Testing)Nicolaidis, MichaelHardcover0792381327 /
9780792381327
04/1998$104.49
Principles of Testing Electronic SystemsMourad, SamihaHardcover0471319317 /
9780471319313
07/2000$174.75
  (8 items found)