| Quantitative X-Ray Spectrometry Contributor(s): Jenkins, Ron (Author) |
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ISBN: 0824795547 ISBN-13: 9780824795542 Publisher: CRC Press OUR PRICE: $332.50 Product Type: Hardcover Published: April 1995 Annotation: This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.; This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines. |
| Additional Information |
| BISAC Categories: - Science | Chemistry - Analytic - Science | Chemistry - Industrial & Technical - Science | Spectroscopy & Spectrum Analysis |
| Dewey: 545.836 |
| LCCN: 95004073 |
| Series: Practical Spectroscopy |
| Physical Information: 1.14" H x 6.22" W x 9.02" (1.69 lbs) 504 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines. |
