| Thin Film Materials: Stress, Defect Formation and Surface Evolution Contributor(s): Freund, Ben (Author), Suresh, Subra (Author), Freund, L. B. (Author) |
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ISBN: 0521822815 ISBN-13: 9780521822817 Publisher: Cambridge University Press OUR PRICE: $98.80 Product Type: Hardcover - Other Formats Published: February 2004 Annotation: This book provides comprehensive coverage of stress, defect formation and surface evolution in thin films. With its balanced coverage of theory, experiment and simulation and many homework problems, the text will be essential reading in senior undergraduate and graduate courses on thin films. |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Materials Science - General - Technology & Engineering | Electronics - Semiconductors |
| Dewey: 621.381 |
| LCCN: 2003043937 |
| Physical Information: 1.73" H x 7.16" W x 9.88" (3.60 lbs) 770 pages |