An Introduction to Sparse Stochastic Processes Contributor(s): Unser, Michael (Author), Tafti, Pouya D. (Author) |
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ISBN: 1107058546 ISBN-13: 9781107058545 Publisher: Cambridge University Press OUR PRICE: $51.29 Product Type: Hardcover - Other Formats Published: October 2014 |
Additional Information |
BISAC Categories: - Technology & Engineering | Signals & Signal Processing - Mathematics | Probability & Statistics - General |
Dewey: 519.23 |
LCCN: 2014003923 |
Physical Information: 0.9" H x 6.7" W x 9.8" (2.10 lbs) 384 pages |
Descriptions, Reviews, Etc. |
Publisher Description: Providing a novel approach to sparsity, this comprehensive book presents the theory of stochastic processes that are ruled by linear stochastic differential equations, and that admit a parsimonious representation in a matched wavelet-like basis. Two key themes are the statistical property of infinite divisibility, which leads to two distinct types of behaviour - Gaussian and sparse - and the structural link between linear stochastic processes and spline functions, which is exploited to simplify the mathematical analysis. The core of the book is devoted to investigating sparse processes, including a complete description of their transform-domain statistics. The final part develops practical signal-processing algorithms that are based on these models, with special emphasis on biomedical image reconstruction. This is an ideal reference for graduate students and researchers with an interest in signal/image processing, compressed sensing, approximation theory, machine learning, or statistics. |
Contributor Bio(s): Tafti, Pouya D.: - Pouya D. Tafti is a data scientist currently residing in Germany, and a former member of the Biomedical Imaging Group at EPFL, where he conducted research on the theory and applications of probabilistic models for data.Unser, Michael: - Michael Unser is Professor and Director of EPFL's Biomedical Imaging Group, Switzerland. He is a member of the Swiss Academy of Engineering Sciences, a Fellow of EURASIP, and a Fellow of the IEEE. |