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Architecture Design for Soft Errors
Contributor(s): Mukherjee, Shubu (Author)
ISBN: 0123695295     ISBN-13: 9780123695291
Publisher: Morgan Kaufmann Publishers
OUR PRICE:   $80.96  
Product Type: Hardcover - Other Formats
Published: February 2008
Qty:
Temporarily out of stock - Will ship within 2 to 5 weeks
Annotation: Soft errors represent very tiny radioactive glitches that occor on microchips. These glitches can result in corrupt data, system malfunctions, and loss of system reliability. Fixing soft errors presents a considerable cost and challenge for chip manufacturers, and this book, Architecture Design for Soft Errors, describes architectural techniques used to tackle soft errors.
To provide readers with a better grasp of the problem definition and solution space, this book delves into physics of soft errors and reviews current circuit and software mitigation techniques as well. This book covers the new methodologies for quantitative analysis of soft errors as well as novel cost-effective architectural techniques to mitigate them. This book also re-evaluates traditional solutions in the context of the new quantitative analysis.
* Provides the methodologies necessary to quantify the effect of radiation-induced soft errors as well as state-of-the-art techniques to protect against them
Additional Information
BISAC Categories:
- Computers | Systems Architecture - General
- Computers | Computer Engineering
- Computers | Microprocessors
Dewey: 621.381
LCCN: 2007048527
Physical Information: 0.95" H x 7.78" W x 9.25" (1.73 lbs) 360 pages
 
Descriptions, Reviews, Etc.
Publisher Description:

Architecture Design for Soft Errors provides a comprehensive description of the architectural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them.

To provide readers with a better grasp of the broader problem definition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. There are a number of different ways this book can be read or used in a course: as a complete course on architecture design for soft errors covering the entire book; a short course on architecture design for soft errors; and as a reference book on classical fault-tolerant machines.

This book is recommended for practitioners in semi-conductor industry, researchers and developers in computer architecture, advanced graduate seminar courses on soft errors, and (iv) as a reference book for undergraduate courses in computer architecture.