| Combined Analysis Contributor(s): Chateigner, Daniel (Author) |
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ISBN: 1848211988 ISBN-13: 9781848211988 Publisher: Wiley-Iste OUR PRICE: $251.70 Product Type: Hardcover - Other Formats Published: July 2010 |
| Additional Information |
| BISAC Categories: - Science | Physics - Crystallography |
| Dewey: 548.83 |
| LCCN: 2010012973 |
| Physical Information: 1.3" H x 6.2" W x 9.2" (1.98 lbs) 496 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: This book introduces and details the key facets of Combined Analysis - an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or other relevant variable or property analyses in a single approach. The text starts with basic theories related to diffraction by polycrystals and some of the most common combined analysis instrumental set-ups are detailed. Also discussed are microstructures of powder diffraction profiles; quantitative phase analysis from the Rietveld analysis; residual stress analysis for isotropic and anisotropic materials; specular x-ray reflectivity, and the various associated models. |