| Design and Test Technology for Dependable Systems-on-Chip Contributor(s): Ubar, Raimund (Editor), Raik, Jaan (Editor), Vierhaus, Heinrich Theodor (Editor) |
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ISBN: 1609602129 ISBN-13: 9781609602123 Publisher: Information Science Reference OUR PRICE: $171.00 Product Type: Hardcover - Other Formats Published: March 2011 |
| Additional Information |
| BISAC Categories: - Computers | Software Development & Engineering - Systems Analysis & Design - Computers | Web - Design |
| Dewey: 621.381 |
| LCCN: 2010045850 |
| Series: Premier Reference Source |
| Physical Information: 1.4" H x 8.6" W x 11.2" (3.55 lbs) 580 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences. Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined classical design and test topics and solutions for IC test technology and fault-tolerant systems. |