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Title Author / Artist Prod Type ISBN/ISBN-13
or UPC		 Pub
Date		 Price
Passive and Active Measurement: 11th International Conference, PAM 2010, Zurich, Switzerland, April 7-9, 2010, Proceedings (Lecture Notes in Computer Science)Krishnamurthy, ArvindPaperback3642123333 /
9783642123337		04/2010$52.24
Risk Topography: Systemic Risk and Macro Modeling (National Bureau of Economic Research Conference Report)Brunnermeier, MarkusHardcover022607773X /
9780226077734		08/2014$116.82
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