| Focused Beam Methods: Measuring Microwave Materials in Free Space Contributor(s): Schultz, John W. (Author) |
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ISBN: 1480092851 ISBN-13: 9781480092853 Publisher: Createspace Independent Publishing Platform OUR PRICE: $28.45 Product Type: Paperback Published: October 2012 |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Microwaves |
| Physical Information: 0.37" H x 6.14" W x 9.21" (0.63 lbs) 142 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Determining the intrinsic microwave properties of materials is important for a variety of applications ranging from antenna and electronic circuit design to remote sensing to electromagnetic interference mitigation. A number of methods exist for characterizing intrinsic properties of materials at microwave frequencies, including transmission lines, resonant cavities, and impedance analysis. The use of free-space measurement methods has become commonplace among microwave material characterization laboratories due to its ease of use and reasonable accuracy. While some free-space facilities exist that can characterize down to 500 MHz, the method is most useful for characterizing materials from 2 GHz through millimeter waves. This book is designed to acquaint engineers and scientists with the theory and practice of using microwave focused beam systems for free-space characterization of materials. |