| Veyvlet-Obrabotka Contributor(s): Belekhov Yaroslav (Author) |
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ISBN: 3659500526 ISBN-13: 9783659500527 Publisher: LAP Lambert Academic Publishing OUR PRICE: $50.17 Product Type: Paperback Language: Russian Published: February 2014 |
| Additional Information |
| BISAC Categories: - Science | Physics - General |
| Physical Information: 0.65" H x 6" W x 9" (0.94 lbs) 288 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: V sovremennom poluprovodnikovom materialovedenii vsye chashche trebuyutsya tekhnologii tsifrovoy obrabotki signalov dlya povysheniya chuvstvitel'nosti i informativnosti metodov diagnostiki strukturnogo sovershenstva monokristallov. Zadacha osobenno aktual'na dlya metodov, predostavlyayushchikh naglyadnoe izobrazhenie vnutrenney struktury kristalla. Predstavlennaya monografiya posvyashchena voprosu primeneniya veyvlet-analiza v tsifrovoy obrabotke izobrazheniy strukturnykh defektov monokristallicheskikh poluprovodnikov. V kachestve eksperimental'noy bazy, rassmatrivayutsya metody rentgenovskoy topografii i polyarizatsionno-opticheskogo analiza. Predstavleno poetapnoe postroenie metodiki i algoritmov veyvlet-obrabotki. Izlozheny osnovnye aspekty veyvlet-obrabotki v zadachakh ustraneniya fonovoy neodnorodnosti polyarizatsionno-opticheskikh izobrazheniy i zernistogo kontrasta rentgenovskikh topograficheskikh snimkov. Rabota osnovyvaetsya na materialakh dissertatsionnogo issledovaniya, posvyashchyennogo dannomu voprosu i provodivshegosya s 2002 po 2006 g. Monografiya mozhet predstavlyat' interes dlya nauchnykh rabotnikov i inzhenernykh spetsialistov v oblasti tekhnologiy materialov mikro- i nanoelektroniki, tsifrovoy obrabotki signalov i izobrazheniy. |
