| Nanometrology Using the Transmission Electron Microscope Contributor(s): Stolojan, Vlad (Author) |
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ISBN: 1681740567 ISBN-13: 9781681740560 Publisher: Morgan & Claypool OUR PRICE: $66.45 Product Type: Paperback - Other Formats Published: October 2015 |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Measurement - Science | Scientific Instruments - Science | Weights & Measures |
| Series: Iop Concise Physics |
| Physical Information: 0.15" H x 7" W x 10" (0.30 lbs) 68 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale. |
Contributor Bio(s): Stolojan, Vlad: - University of Surrey, UK |
